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Diffraction intensity due to multiple slits and grids
  • Diffraction intensity due to multiple slits and grids

Diffraction intensity due to multiple slits and grids

공유
모델명
P2230400
브랜드
PHYWE
판매가
견적 문의
배송비
￦2,500 / 주문시결제(선결제) 조건별배송
택배
방문 수령지 : 경기도 고양시 덕양구 향동로 194(향동동) DMC아미 지식산업센터 501호

 

Features
Principle
Multiple slits which all have the same width and the same distance among each other, as well as transmission grids with different grid constants, are submitted to laser light. The corresponding diffraction patterns are measured according to their position and intensity, by means of a photo diode which can be shifted.
Benefits
understand what makes an optical grid work, by approaching it via "multiple slits"
the coherent light of a laser gives the possibility of easy observation
clear correlation of measurement results to the underlying theory
Tasks
1. The position of the first intensity minimum due to a single slit is determined, and the value is used to calculate the width of the slit.
2. The intensity distribution of the diffraction patterns of a threefold, fourfold and even a fivefold slit, where the slits all have the same widths and the same distance among each other, is to be determined. The intensity relations of the central peaks are to be assessed.
3. For transmission grids with different lattice constants, the position of the peaks of several orders of diffraction is to be determined, and the found value used to calculate the wavelength of the laser light.
What you can learn about
Huygens principle
Interference
Fraunhofer und Fresnel diffraction
Coherence

 

 

 

 

Descripsion Code Q'ty
Slide mount for optical bench expert, h = 30 mm 08286-01 5,00
Lens holder 08012-00 2,00
Connecting cord, 32 A, 750 mm, red 07362-01 1,00
Diffraction grating, 8 lines/mm 08534-00 1,00
Si-Photodetector with Amplifier 08735-00 1,00
Diaphragm, 3 single slits 08522-00 1,00
Lens, mounted, f +20 mm 08018-01 1,00
Diffraction grating,10 lines/mm 08540-00 1,00
Optical bench expert, l = 1500 mm 08281-00 1,00
Control Unit for Si-Photodetector 08735-99 1,00
Diaphragm, 4 multiple slits 08526-00 1,00
Lens, mounted, f +100 mm 08021-01 1,00
Adapter, BNC-plug/socket 4 mm 07542-26 1,00
Diffraction grating,50 lines/mm 08543-00 1,00
Base for optical bench expert, adjustable 08284-00 2,00
Digital Multimeter, 2.000 Counts, 600V AC/DC, 10A, with NiCr-Ni thermocouple and inductance measurement 07129-00 1,00
Diffraction grating, 4 lines/mm 08532-00 1,00
Object holder, 5x5 cm 08041-00 1,00
Sliding device, horizontal 08713-00 1,00
Connecting cord, 32 A, 750 mm, blue 07362-04 1,00

 

 

배송안내

- 배송비 : 기본배송료는 2,500원 입니다. (도서,산간,오지 일부지역은 배송비가 추가될 수 있습니다)  100,000원 이상 구매시 무료배송입니다.

- 본 상품의 평균 배송일은 2일입니다. 설치 상품의 경우 다소 늦어질수 있습니다.

교환 및 반품안내

- 개봉으로 상품 가치 훼손 시에는 상품수령후 7일 이내라도 교환 및 반품이 불가능합니다.

- 저단가 상품, 일부 특가 상품은 고객 변심에 의한 교환, 반품은 고객께서 배송비를 부담하셔야 합니다(제품의 하자,배송오류는 제외)

- 일부 상품은 신모델 출시, 부품가격 변동 등 제조사 사정으로 가격이 변동될 수 있습니다.

환불안내

- 상품 청약철회 가능기간은 상품 수령일로 부터 7일 이내 입니다.

AS안내

- 소비자분쟁해결 기준(공정거래위원회 고시)에 따라 피해를 보상받을 수 있습니다.

- A/S는 판매자에게 문의하시기 바랍니다.

이미지 확대보기Diffraction intensity due to multiple slits and grids

Diffraction intensity due to multiple slits and grids
  • Diffraction intensity due to multiple slits and grids
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