HOME  > 
PHYWE
 > 
ModernPhysics
Basic methods in imaging of micro and nanostructures with AFM (Atomic Force Microscopy)
  • Basic methods in imaging of micro and nanostructures with AFM (Atomic Force Microscopy)

Basic methods in imaging of micro and nanostructures with AFM (Atomic Force Microscopy)

공유
모델명
P2538000D
브랜드
PHYWE
판매가
견적 문의
배송비
￦2,500 / 주문시결제(선결제) 조건별배송
택배
방문 수령지 : 경기도 고양시 덕양구 향동로 194(향동동) DMC아미 지식산업센터 501호

 

Features
Principle
Approaching a sharp silicon tip mounted on a cantilever to a sample surface leads to an atomic scale interaction. The result is a bend of the cantilever which is detected by a laser. In static mode the resulting deflection is used to investigate the topography of the sample surface line by line using a feedback loop. In dynamic mode the cantilever is oscillated at fixed frequency resulting in a damped amplitude near the surface. The measurement parameters (setpoint, feedback gain) play a crucial role for image quality. Their effect on the imaging quality is investigated for different nano structured samples.
Benefits
Investigation in static and dynamic mode
Modification of numerous parameters to optimize image quality
Perform experiment with different samples
Excellent price-performance ratio
Custom-designed for use in teaching labs
Microscope consists of one compact, portable instrument, no additional instruments required
Vibration isolated for better and reproducible results
Tasks
1. Learn how to mount a cantilever (with tip) and approach the tip towards a sample.
2. Investigate the influence of the scanning parameters on the imaging quality and performance, e.g. PID gain, setpoint (force), vibrational amplitude, and scanning speed. Use both static and dynamic force mode.
3. Image different samples (microstructures, carbon nano tubes, skin cross-section, bacteria, CD stamper, chip structure, glass beads) by optimizing the parameters respectively.
What you can learn about
Atomic Force Microscopy (AFM)
Lennard-Jones potential
Imaging of nano structures
Static Force Mode
Dynamic Force Mode
Feedback loop
Force
Vibrational amplitude
Software included. Computer not provided.

 

 

 

 

Descripsion Code Q'ty
Compact AFM, Atomic Force Microscope 09700-99D 0,00

 

 

배송안내

- 배송비 : 기본배송료는 2,500원 입니다. (도서,산간,오지 일부지역은 배송비가 추가될 수 있습니다)  100,000원 이상 구매시 무료배송입니다.

- 본 상품의 평균 배송일은 2일입니다. 설치 상품의 경우 다소 늦어질수 있습니다.

교환 및 반품안내

- 개봉으로 상품 가치 훼손 시에는 상품수령후 7일 이내라도 교환 및 반품이 불가능합니다.

- 저단가 상품, 일부 특가 상품은 고객 변심에 의한 교환, 반품은 고객께서 배송비를 부담하셔야 합니다(제품의 하자,배송오류는 제외)

- 일부 상품은 신모델 출시, 부품가격 변동 등 제조사 사정으로 가격이 변동될 수 있습니다.

환불안내

- 상품 청약철회 가능기간은 상품 수령일로 부터 7일 이내 입니다.

AS안내

- 소비자분쟁해결 기준(공정거래위원회 고시)에 따라 피해를 보상받을 수 있습니다.

- A/S는 판매자에게 문의하시기 바랍니다.

이미지 확대보기Basic methods in imaging of micro and nanostructures with AFM (Atomic Force Microscopy)

Basic methods in imaging of micro and nanostructures with AFM (Atomic Force Microscopy)
  • Basic methods in imaging of micro and nanostructures with AFM (Atomic Force Microscopy)
닫기

비밀번호 인증

글 작성시 설정한 비밀번호를 입력해 주세요.

닫기

장바구니 담기

상품이 장바구니에 담겼습니다.
바로 확인하시겠습니까?

찜 리스트 담기

상품이 찜 리스트에 담겼습니다.
바로 확인하시겠습니까?