Features |
Principle |
Approaching a very sharp metal tip to an electrically conductive sample by applying a electrical field leads to a current between tip and sample without any mechanical contact. This so-called tunneling current is used to investigate the electronic topography on the sub nanometer scale of a fresh prepared graphite (HOPG) surface. By scanning the tip line by line across the surface graphite atoms and the hexagonal structure are imaged. |
Benefits |
Observe atoms within minutes |
Custom-designed for use in teaching labs |
Microscope consists of one compact, portable instrument, no additional instruments required |
Vibration-isolated for better and reproducible results |
Can be used both for imaging of atomic resolution and for spectroscopy |
Additional experiment with gold sample can be performed |
With interactive teaching and learning software |
Tasks |
1. Prepare a Pt-Ir tip and the graphite (HOPG) sample and approach the tip to the sample. |
2. Investigate the topography of clean terraces and the step height between neighboring terraces in constant-current mode. |
3. Image the arrangement of graphite atoms on a clean terrace by optimizing tunneling and scanning parameters. Interpret the structure by analyzing angles and distances between atoms and atomic rows and by using the 2D and 3D graphite model. |
4. Measure and compare images in the constant-height and constant-current modes. |
What you can learn about |
Tunneling effect |
Hexagonal structures |
Scanning Tunneling Microscopy (STM) |
Imaging on the sub nanometer scale |
Piezo-electric devices |
Local Density Of States (LDOS) |
Constant-Height-Mode |
Constant-Current-Mode |
Software included. Computer not provided. |
Descripsion | Code | Q'ty |
Compact STM, Scanning Tunneling Microscope | 09600-99 | 1,00 |
Graphite model, 2D | 09620-00 | 1,00 |
Crystal lattice kit: graphite | 39840-00 | 1,00 |
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