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X-ray fluorescence spectroscopy – layer thickness determination
  • X-ray fluorescence spectroscopy – layer thickness determination

X-ray fluorescence spectroscopy – layer thickness determination

공유
모델명
P2545201
브랜드
PHYWE
판매가
견적 문의
배송비
￦2,500 / 주문시결제(선결제) 조건별배송
택배
방문 수령지 : 경기도 고양시 덕양구 향동로 194(향동동) DMC아미 지식산업센터 501호

 

Features
Principle
X-ray fluorescence analysis (XRF) is suitable for the non-contact and non-destructive thickness measurement of thin layers as well as for determining their chemical composition. For this type of measurement, the X-ray source and detector are located on the same side of the sample. When the layer on the substrate is subjected to X-rays, the radiation will penetrate the layer, if it is sufficiently thin, to a certain extent, depending on the thickness, and in turn cause characteristic fluorescence radiation in the material of the underlying substrate. On its way to the detector, this fluorescence radiation will be attenuated by absorption at the layer. The thickness of the layer can be determined based on the intensity attenuation of the fluorescence radiation of the substrate material.
Tasks
1. Calibrate the semiconductor energy detector.
2. Measure fluorescence spectrum of the iron substrate with different numbers n of pieces of aluminium foil with the same thickness placed on the substrate (including n = 0). Determine the intensity of the Fe-Kα fluorescence line.
3. Plot the intensity of the Fe-Kα fluorescence line as a function of the number of pieces of aluminium foil placed on the substrate in linear and semilogarithmic way.
4. Determine the intensity of the Fe-Kα fluorescence line for various numbers of pieces of aluminium foil that are fastened in front of the outlet of the tube of the energy detector.
5. Calculate the thickness of the aluminium foil.
6. Execute tasks 2 to 4 for copper foil on molybdenum or zinc substrate.
What you can learn about
Bremsstrahlung
characteristic X-radiation
fluorescent yield
Auger effect
coherent and incoherent photon scattering
law of absorption
mass attenuation coefficient
saturation thickness
matrix effects
semiconductor
energy detectors
multi-channel analysers

 

 

 

 

Descripsion Code Q'ty
XR 4.0 X-ray specimen set metals for fluorescence, set of 4 09058-34 1,00
XR 4.0 X-ray Diaphragm tube d = 1 mm 09057-01 1,00
XR 4.0 X-ray Universal crystal holder for X-ray unit 09058-02 1,00
XR 4.0 XRED cable, 2 m 09058-35 1,00
XR 4.0 X-ray Diaphragm tube d = 2 mm 09057-02 1,00
XR 4.0 X-ray plug-in W tube 09057-81 1,00
XR 4.0 X-ray energy detector (XRED) 09058-30 1,00
PHYWE Multichannel Analyser (MCA) 13727-99 1,00
XR 4.0 X-ray goniometer 09057-10 1,00
XR 4.0 X-ray specimen set of 6 metals 09058-31 1,00
measure Software multi channel analyser 14452-61 1,00
XR 4.0 expert unit, 35 kV 09057-99 1,00
Screened cable, BNC, l = 750 mm 07542-11 1,00

 

 

배송안내

- 배송비 : 기본배송료는 2,500원 입니다. (도서,산간,오지 일부지역은 배송비가 추가될 수 있습니다)  100,000원 이상 구매시 무료배송입니다.

- 본 상품의 평균 배송일은 2일입니다. 설치 상품의 경우 다소 늦어질수 있습니다.

교환 및 반품안내

- 개봉으로 상품 가치 훼손 시에는 상품수령후 7일 이내라도 교환 및 반품이 불가능합니다.

- 저단가 상품, 일부 특가 상품은 고객 변심에 의한 교환, 반품은 고객께서 배송비를 부담하셔야 합니다(제품의 하자,배송오류는 제외)

- 일부 상품은 신모델 출시, 부품가격 변동 등 제조사 사정으로 가격이 변동될 수 있습니다.

환불안내

- 상품 청약철회 가능기간은 상품 수령일로 부터 7일 이내 입니다.

AS안내

- 소비자분쟁해결 기준(공정거래위원회 고시)에 따라 피해를 보상받을 수 있습니다.

- A/S는 판매자에게 문의하시기 바랍니다.

이미지 확대보기X-ray fluorescence spectroscopy – layer thickness determination

X-ray fluorescence spectroscopy – layer thickness determination
  • X-ray fluorescence spectroscopy – layer thickness determination
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